DocumentCode :
744868
Title :
The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips
Author :
Abadal, Gabriel ; Pérez-Murano, Francesc ; Barniol, Nuria ; Aymerich, X.
Author_Institution :
Departament d´´Enginyeria Electronica, Univ. Autonoma de Barcelona, Spain
Volume :
52
Issue :
3
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
859
Lastpage :
864
Abstract :
A new method to characterize the uncoated area of electrochemical scanning tunneling microscopy (ESTM) tips based on the measurement of the rms tip current noise is presented. A clear relationship between this noise and the exposed area measured by means of different standard techniques is shown. A simple model based on the tip-electrolyte system allows adjustment of the relationship. The new technique is advantageous with respect to the standard methods because it is nondestructive and because it can be applied in situ during an ESTM experiment, allowing continuous monitoring of the tip coating state.
Keywords :
electric noise measurement; electrochemical devices; scanning tunnelling microscopy; ESTM coated tip; electrochemical scanning tunneling microscopy; exposed area; nondestructive method; tip current noise measurement; tip-electrolyte system; Area measurement; Coatings; Current measurement; Insulation; Measurement standards; Monitoring; Noise measurement; Scanning electron microscopy; Semiconductor device noise; Tunneling;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.814683
Filename :
1213673
Link To Document :
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