Title :
The Hilbert space geometry of the Rihaczek distribution for stochastic analytic signals
Author :
Scharf, Louis L. ; Schreier, Peter J. ; Hanssen, Alfred
Author_Institution :
Depts. of Electr. & Comput. Eng. & Stat., Colorado State Univ., Ft. Collins, CO, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
The Rihaczek distribution for stochastic signals is a time- and frequency-shift covariant bilinear time-frequency distribution (TFD) based on the Crame´r-Loe`ve spectral representation for a harmonizable process. It is a complex Hilbert space inner product (or cross correlation) between the time series and its infinitesimal stochastic Fourier generator. To this inner product, we may attach an illuminating geometry, wherein the cosine squared of the angle between the time series and its infinitesimal stochastic Fourier generator is given by the Rihaczek distribution. The Rihaczek distribution also determines a time-varying Wiener filter for estimating a time series from its infinitesimal stochastic Fourier generator and measures the resulting error covariance. We propose a factored kernel to construct estimators of the Rihaczek distribution that are contained in Cohen´s class of bilinear TFDs.
Keywords :
Hilbert spaces; Wiener filters; random processes; signal representation; time series; time-frequency analysis; Cohen´s class; Cramer-Loeve spectral representation; Hilbert space geometry; Rihaczek distribution; TFD; bilinear time-frequency distribution; error covariance; improper complex random process; infinitesimal stochastic Fourier generator; nonstationary time series; stochastic analytic signal; time-frequency analysis; time-frequency shift covariant; tune-varying Wiener filter; Frequency; Geometry; Hilbert space; Kernel; Random processes; Signal analysis; Signal processing; Stochastic processes; Time measurement; Wiener filter; Complementary correlation; CramÉr–LoÈve spectral representation; improper complex random process; nonstationary time series; time–frequency analysis;
Journal_Title :
Signal Processing Letters, IEEE
DOI :
10.1109/LSP.2005.843772