DocumentCode
745119
Title
Fault isolation for nonisolated blocks
Author
Pomeranz, Irith ; Zorian, Yervant
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
12
Issue
12
fYear
2004
Firstpage
1385
Lastpage
1388
Abstract
We consider circuits represented as interconnections of logic blocks. In such circuits, the goal of fault isolation is to identify which one of the blocks is faulty based on a faulty output response produced by the circuit. We study this issue and demonstrate that perfect or close-to-perfect fault isolation is possible with tests that propagate fault effects through pairs of blocks. We relate this phenomenon to the numbers of fault effects observed on the circuit outputs for faults in different blocks. For cases where fault isolation is not perfect, we insert observation points to ensure perfect fault isolation. We also study the number of tests required to achieve perfect fault isolation. The study is performed for single stuck-at faults in combinational (or full scan) blocks.
Keywords
combinational circuits; fault diagnosis; interconnections; logic testing; combinational blocks; fault isolation; logic block interconnection; nonisolated blocks; stuck-at faults; Automatic testing; Circuit faults; Circuit testing; Delay; Design automation; Design methodology; Europe; Fault diagnosis; Integrated circuit interconnections; Logic circuits; Fault diagnosis; fault isolation; test-points;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2004.837994
Filename
1407959
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