DocumentCode :
745139
Title :
Surface roughness and slope measurements using polarimetric SAR data
Author :
Schuler, Dale L. ; Lee, Jong-Sen ; Kasilingam, Dayalan ; Nesti, Giuseppe
Author_Institution :
Remote Sensing Div., Naval Res. Lab., Washington, DC, USA
Volume :
40
Issue :
3
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
687
Lastpage :
698
Abstract :
In this paper, the circular polarization coherence, ρRRLL , is investigated as a potential estimator of terrain surface roughness and small-scale slopes. The studies utilize microwave backscatter collected from 1) dielectric surfaces in an anechoic chamber and 2) a desert test site using P-, L-, and C-band NASA/JPL AIRSAR data. These experimental studies and supporting theory, indicate a sensitive decrease of |ρRRLL| with increasing surface roughness ks over a range 0 ⩽ ks ⩽ 1. For the present studies this decrease is caused largely by the depolarizing effects of small-scale surface slopes in the azimuth direction rather than by volume, or multiple scatter. For cases when the scatter is reflection symmetric, the value of |ρRRLL| depends on the surface roughness and on the local incidence angle. The dependence of |ρPRRLL| on the local incidence angle is supported by theory and experimental results. For these same scattering cases, however, |ρPRRLL| is independent of the surface dielectric constant. Estimation of the functional dependency of |ρPRRLL| versus ks, for a mid-range incidence angle, has been carried out using roughness estimates derived from an empirical model
Keywords :
geophysical techniques; radar polarimetry; remote sensing by radar; synthetic aperture radar; terrain mapping; topography (Earth); 0.2 to 6 GHz; SAR; circular polarization coherence; desert; geophysical measurement technique; land surface topography; polarimetric SAR; radar polarimetry; radar remote sensing; slope; small-scale slopes; surface roughness; synthetic aperture radar; terrain mapping; Anechoic chambers; Azimuth; Backscatter; Dielectric measurements; NASA; Polarization; Rough surfaces; Scattering; Surface roughness; Testing;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
Publisher :
ieee
ISSN :
0196-2892
Type :
jour
DOI :
10.1109/TGRS.2002.1000328
Filename :
1000328
Link To Document :
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