• DocumentCode
    745464
  • Title

    High-power P-i-N diode with local lifetime control using palladium diffusion controlled by radiation defects

  • Author

    Vobecky, J. ; Hazdra, P.

  • Author_Institution
    Dept. of Microelectron., Czech Tech. Univ., Prague, Czech Republic
  • Volume
    26
  • Issue
    12
  • fYear
    2005
  • Firstpage
    873
  • Lastpage
    875
  • Abstract
    We demonstrate for the first time a high-power P-i-N diode with local lifetime control using palladium (Pd) diffusion. Low-temperature (600/spl deg/C-700/spl deg/C) diffusion of Pd is stimulated by radiation defects resulting from alpha-particle irradiation (4He/sup 2+/: 10 MeV, 10/sup 12/ cm/sup -2/). The region of maximal radiation damage of Gaussian shape is decorated by substitutional Pd after diffusion from a palladium silicide surface layer through the P/sup +/--P region into the N-base close to the anode junction. Significantly lower leakage current compared to that of standard 4He/sup 2+/ irradiation and very good ruggedness under fast recovery (di/dt/spl ap/500 A/μs, V/sub R//spl ap/2 kV) is demonstrated for Pd diffusion at 600/spl deg/C.
  • Keywords
    alpha-particle effects; carrier lifetime; diffusion; helium ions; p-i-n diodes; palladium; power semiconductor diodes; 600 to 700 C; Gaussian shape; Si:Pd; alpha-particle irradiation effects; high-power p-i-n diodes; local lifetime control; palladium diffusion; palladium silicide surface layer; radiation damage; radiation defects; Annealing; Anodes; Gold; Leakage current; P-i-n diodes; Palladium; Silicides; Silicon; Temperature control; Helium irradiation; lifetime control; palladium diffusion; power diode; silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2005.859642
  • Filename
    1546138