Robust and universal constant-g/sub m/ circuit technique [operational amplifiers]

Author

Duque-Carrillo, J.F. ; Carrillo, J.M. ; Ausin, J.L. ; Sanchez-Sinencio, Edgar

Author_Institution

Dept. of Electron. & Electr. Eng., Univ. de Extremadura, Badajoz, Spain

Volume

38

Issue

9

fYear

2002

fDate

4/25/2002 12:00:00 AM

Firstpage

396

Lastpage

397

Abstract

A robust and universal circuit technique to maintain a constant transconductance, g/sub m/, in rail-to-rail amplifiers based on input stages made up of parallel-connected complementary differential pairs, is presented. The technique is universal, since it is valid regardless of the g/sub m//I/sub D/ characteristic of input devices. Also, the accuracy does not depend on any condition for matching n- to p-channel input transistors, which makes the technique robust. Experimental results obtained from a 0.8 /spl mu/m CMOS test-chip prototype, are given.

Keywords

CMOS analogue integrated circuits; integrated circuit design; integrated circuit testing; operational amplifiers; 0.8 micron; CMOS test-chip prototype; constant transconductance; input device g/sub m//I/sub D/ characteristic; input stages; n-channel input transistors; p-channel input transistors; parallel-connected complementary differential pairs; rail-to-rail amplifiers; rail-to-rail operational amplifiers; robust universal constant-g/sub m/ circuit technique; robust universal constant-transconductance circuit technique; universal circuit technique;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:20020277

Filename

1001533