Title :
Performance of BPSK with open-loop tanlock carrier recovery
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore
fDate :
3/2/1995 12:00:00 AM
Abstract :
The operational and performance advantages of a recently proposed open-loop tanlock carrier recovery structure for BPSK over conventional closed-loop structures are pointed out. Error rate results for the former, obtained via computer simulations over the Rician fading channel and the random phase channel, are presented to show its performance characteristics
Keywords :
Rician channels; digital communication; error statistics; fading; phase shift keying; signal detection; BPSK; Rician fading channel; binary PSK; error rate results; open-loop tanlock carrier recovery; performance characteristics; random phase channel;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19950227
