• DocumentCode
    746149
  • Title

    A 0.35-μm CMOS analog turbo decoder for the 40-bit rate 1/3 UMTS channel code

  • Author

    Vogrig, Daniele ; Gerosa, Andrea ; Neviani, Andrea ; Amat, Alexandre Graell I ; Montorsi, Guido ; Benedetto, Sergio

  • Author_Institution
    Dipt. di Ingegneria dell´´Informazione, Univ. di Padova, Italy
  • Volume
    40
  • Issue
    3
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    753
  • Lastpage
    762
  • Abstract
    This work presents the design and the test results of an analog decoder for the 40-bit block length, rate 1/3, Turbo Code defined in the UMTS standard. The prototype is fully integrated in a three-metal double-poly 0.35-μm CMOS technology, and includes an I/O interface that maximizes the decoder throughput. After the successful implementation of proof-of-concept analog iterative decoders by different research groups in both bipolar and CMOS technologies, this is the first reported prototype of an analog decoder for a realistic error-correcting code. The decoder was successfully tested at the maximum data rate defined in the standard (2 Mb/s), with an overall power consumption of 10.3 mW at 3.3 V, going down to 7.6 mW with the decoder core operated at 2 V, and an extremely low energy per decoded bit and trellis state (0.85 nJ for the decoder core alone).
  • Keywords
    3G mobile communication; CMOS analogue integrated circuits; channel coding; error correction codes; iterative decoding; turbo codes; 0.35 micron; 10.3 mW; 2 Mbit/s; 2 V; 3.3 V; 40 bit; 7.6 mW; CMOS analog turbo decoder; I/O interface; UMTS channel code; analog decoder; analog iterative decoders; decoder throughput; error-correcting code; neuromorphic circuits; translinear circuits; turbo code; weak inversion; 3G mobile communication; CMOS technology; Code standards; Energy consumption; Error correction codes; Iterative decoding; Prototypes; Testing; Throughput; Turbo codes; Analog decoding; Turbo Codes; iterative decoding; neuromorphic circuits; translinear circuits; weak inversion;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2005.843628
  • Filename
    1408096