• DocumentCode
    746386
  • Title

    Analysis of new high-voltage bipolar Silicon-On-Insulator transistor with fully depleted collector

  • Author

    Arnborg, T. ; Litwin, Andrej

  • Author_Institution
    Ericsson Components AB, Stockholm, Sweden
  • Volume
    42
  • Issue
    1
  • fYear
    1995
  • fDate
    1/1/1995 12:00:00 AM
  • Firstpage
    172
  • Lastpage
    177
  • Abstract
    A new type of high voltage bipolar transistor for implementation in SOI material (Silicon-On-Insulator) has been developed. It is shown by measurements on fabricated structures and by numerical device simulations that the current drive capability of such a transistor is comparable to what has been achieved in a conventional transistor with buried layer and plug or in any optimized lateral transistor with buried emitter and collector layers. The new type of transistor designed in a few micrometer thick silicon layer has a breakdown voltage BVCEO in excess of several hundreds volts and also a remarkably high Early voltage of about 400 volts. This unique Early voltage is also explained in detail by a new analytical model. The transistor is expected to have a strong impact on the feasibility to realize mixed analog and digital signal circuits with high and low voltage functions on the same chip
  • Keywords
    electric breakdown; power bipolar transistors; semiconductor device models; silicon-on-insulator; 400 V; Early voltage; breakdown voltage; current drive capability; fabricated structure measurements; fully depleted collector; high-voltage bipolar SOI transistor; mixed analog and digital signal circuits; numerical device simulations; Analytical models; Bipolar transistors; Current measurement; Dielectric substrates; Insulation; Numerical simulation; Plugs; Silicon on insulator technology; Voltage; Wafer bonding;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.370020
  • Filename
    370020