DocumentCode :
746432
Title :
A low-phase-noise 0.004-ppm/step DCXO with guaranteed monotonicity in the 90-nm CMOS process
Author :
Lin, Jerry
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Volume :
40
Issue :
12
fYear :
2005
Firstpage :
2726
Lastpage :
2734
Abstract :
This paper presents an integrated 26-MHz digitally controlled crystal oscillator (DCXO) for GSM standard that achieves a phase noise of -140 dBc/Hz at 1 kHz and -152 dBc/Hz at 10 kHz offset. The measured supply pushing at 26 MHz is 0.5 ppm/V. Frequency tuning is done by a predistorted 14-bit MOS capacitor digital-to-analog converter (DAC) where the top 10 bits are thermometer coded and the bottom 4 bits are ΣΔ modulated. Monotonicity of ∼0.004 ppm/step across the entire ∼70 ppm tuning range is guaranteed by applying a sliding ΣΔ modulation to the last exercised thermometer element. This DCXO consumes 3 mW at 1.4 V supply and occupies 0.18 mm2 in the 90-nm CMOS process.
Keywords :
CMOS analogue integrated circuits; cellular radio; crystal oscillators; digital-analogue conversion; mobile handsets; modulators; 1.4 V; 14 bit; 26 MHz; 3 mW; 90 nm; CMOS process; MOS capacitor digital-to-analog converter; digitally controlled crystal oscillator; low-phase-noise DCXO; mobile handsets; sliding ΣΔ modulation; CMOS process; Digital control; Digital-analog conversion; Frequency conversion; Frequency measurement; GSM; MOS capacitors; Oscillators; Phase noise; Tuning; Bluetooth; CMOS oscillator; DCXO; GSM; VCTCXO; VCXO; WLAN; crystal oscillator; digital trimming; impedance boost; monotonic DAC; phase noise; sub-ppm accuracy;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2005.856580
Filename :
1546247
Link To Document :
بازگشت