DocumentCode :
746434
Title :
Comparative analysis of the method-of-lines for three-dimensional curved dielectric waveguides
Author :
Burton, Richard S. ; Schlesinger, Tuviah E.
Author_Institution :
Compound Semicond. Technol., Motorola Inc., Tempe, AZ, USA
Volume :
14
Issue :
2
fYear :
1996
fDate :
2/1/1996 12:00:00 AM
Firstpage :
209
Lastpage :
216
Abstract :
We discuss the effects of waveguide geometry on the radiation loss of tightly curved multimode dielectric waveguides. Three waveguide geometries are investigated: a ridge waveguide, a buried waveguide, and an interdiffused waveguide. We compare the effective index method with both semi- and full-vectorial method-of-lines analyses for these waveguide geometries. This comparison shows that the effective index method is accurate for curved waveguides except where the outer confinement region is in cut-off or, in the case of TM-polarization, for the ridge waveguide. In the latter case, the full-vectorial method-of-lines predicts a resonant feature of the TM-mode radiation loss of curved ridge waveguides; this is not predicted by either the semivectorial method-of-lines or the effective index method
Keywords :
bending; dielectric waveguides; diffusion; geometry; optical losses; optical waveguide theory; refractive index; vectors; TM-mode radiation loss; TM-polarization; buried waveguide; comparative analysis; curved ridge waveguides; curved waveguides; cut-off; effective index method; full-vectorial method-of-lines; full-vectorial method-of-lines analyses; interdiffused waveguide; method-of-lines; outer confinement region; radiation loss; ridge waveguide; semivectorial method-of-lines; three-dimensional curved dielectric waveguides; tightly curved multimode dielectric waveguides; waveguide geometries; waveguide geometry; Dielectric losses; Electromagnetic propagation; Electromagnetic waveguides; Geometry; Integrated optics; Optical design; Optical losses; Optical waveguides; Resonance; Signal design;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.482265
Filename :
482265
Link To Document :
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