DocumentCode
746438
Title
An excellent weight-updating-linearity EEPROM synapse memory cell for self-learning Neuron-MOS neural networks
Author
Kosaka, Hideo ; Shibata, Tadashi ; Ishii, Hiroshi ; Ohmi, Tadahiro
Author_Institution
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
Volume
42
Issue
1
fYear
1995
fDate
1/1/1995 12:00:00 AM
Firstpage
135
Lastpage
143
Abstract
A new synapse memory cell employing floating-gate EEPROM technology has been developed which is characterized by an excellent weight-updating linearity under the constant-pulse programming. Such a feature has been realized for the first time by employing a simple self-feedback regime in each cell circuitry. The potential of the floating gate is set to the tunneling electrode by the source follower action of the built-in cell circuitry, thus assuring a constant electric field strength in the tunnel oxide at each programming cycle independent of the stored charge in the floating gate. The synapse cell is composed of only seven transistors and inherits all the advanced features of the original six-transistor cell, such as the standby-power free and dual polarity characteristics. In addition, by optimizing the intra-cell coupling capacitance ratios, the acceleration effect in updating the weight has also been accomplished. All these features make the new synapse cell fully compatible with the hardware learning architecture of the Neuron-MOS neural network. The new synapse cell concept has been verified by experiments using test circuits fabricated by a double-polysilicon CMOS process
Keywords
CMOS memory circuits; EPROM; PLD programming; neural chips; programmable logic devices; recurrent neural nets; unsupervised learning; EEPROM synapse memory cell; constant electric field strength; constant-pulse programming; double-polysilicon CMOS process; dual polarity characteristics; floating-gate EEPROM technology; intra-cell coupling capacitance ratios; programming cycle; self-feedback regime; self-learning neuron-MOS neural networks; source follower action; standby-power free characteristics; tunneling electrode; weight-updating linearity; Capacitance; Circuit testing; Coupling circuits; EPROM; Electrodes; Linear programming; Linearity; Nonvolatile memory; Transistors; Tunneling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.370025
Filename
370025
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