Electro-optic imagery of high-voltage GaAs photoconductive switches

Author

Falk, R.A. ; Adams, Jeff C. ; Capps, C.D. ; Ferrier, Stuart G. ; Krinsky, Jeff A.

Author_Institution

Boeing Defense & Space Group, Seattle, WA, USA

Volume

42

Issue

1

fYear

1995

fDate

1/1/1995 12:00:00 AM

Firstpage

43

Lastpage

49

Abstract

We present electro-optic images of GaAs high-voltage photoconductive switches utilizing the electro-optic effect of the semi-insulating GaAs substrate. Experimental methodology for obtaining the images is described along with a self-calibrating data reduction algorithm. Use of the technique for observing fabrication defects is shown

Keywords

III-V semiconductors; data reduction; electro-optical effects; gallium arsenide; image processing; photoconducting switches; power semiconductor switches; semiconductor device testing; GaAs; HV switches; electro-optic effect; electro-optic images; fabrication defects observation; high-voltage photoconductive switches; self-calibrating data reduction algorithm; semi-insulating GaAs substrate; Absorption; Electrooptic devices; Gallium arsenide; High speed optical techniques; Nonlinear optics; Optical switches; Photoconducting devices; Photoconductivity; Probes; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.370037

Filename

370037