• DocumentCode
    746602
  • Title

    Optical control and injection locking of monolithically integrated In0.53Ga0.47As/In0.52Al0.48 As MODFET oscillators

  • Author

    Yang, David ; Bhattacharya, Pallab ; Lai, Richard ; Brock, Timothy ; Paolella, Arthur

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    42
  • Issue
    1
  • fYear
    1995
  • fDate
    1/1/1995 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    37
  • Abstract
    Optical tuning and injection locking characteristics of MMIC oscillators made with InP-based 0.25 μm gate In0.53Ga0.47As/In0.52Al0.48 As modulation-doped field-effect transistors (MODFETs) have been investigated. Optical tuning has been performed on the X- and R-band oscillator circuits and a maximum tuning range of 8.7 MHz and 11.7 MHz, respectively, has been measured. The tuning characteristics have been explained in terms of changes in the MODFET characteristics with absorption of incident light. Direct optical subharmonic injection locking of these oscillator circuits have been done at 10 and 19 GHz, which are the highest achieved for InP-based MMIC´s
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC oscillators; aluminium compounds; circuit tuning; field effect MMIC; gallium arsenide; indium compounds; injection locked oscillators; microwave oscillators; variable-frequency oscillators; 0.25 micron; 10 GHz; 19 GHz; In0.53Ga0.47As-In0.52Al0.48 As; MMIC oscillators; MODFET oscillators; R-band oscillator circuits; SHF; X-band oscillator circuits; incident light absorption; injection locking characteristics; modulation-doped FET; monolithically integrated oscillators; optical control; optical subharmonic injection locking; optical tuning; Circuit optimization; Epitaxial layers; FETs; Field effect MMICs; HEMTs; Injection-locked oscillators; MODFET circuits; MODFET integrated circuits; Optical control; Optical tuning;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.370039
  • Filename
    370039