• DocumentCode
    746835
  • Title

    Characterization of MEMS transducer performance using near-field scanning interferometry

  • Author

    Blackshire, James L. ; Sathish, S.

  • Author_Institution
    Center for Mater. Diagnostics, Dayton Univ., OH, USA
  • Volume
    49
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    669
  • Lastpage
    674
  • Abstract
    Sophisticated ultrasonic transducer microarrays based on micro-electro-mechanical-systems (MEMS) technologies are quickly becoming a reality. A current challenge for many researchers is characterizing the dynamic performance of these and other micro-mechanical devices. In this work, the performance characteristics of a MEMS ultrasonic transducer array were successfully measured using a scanning heterodyne interferometer system. The dynamic response of the entire transducer array was measured, and the results were compared with theoretical predictions. Individual elements were found to vibrate with Bessel-like displacement patterns, and they were resonant at approximately 4 MHz. The full array showed variations in peak out-of-plane displacement levels across the device of /spl sim/16%, and isolated elements that were dramatically over-responsive and under-responsive. The measured variations across the array may have an undesirable impact on the performance of the transducer and its radiated field.
  • Keywords
    Bessel functions; displacement measurement; dynamic response; light interferometry; micromechanical resonators; ultrasonic transducer arrays; Bessel-like displacement patterns; MEMS transducer performance; dynamic performance; dynamic response; near-field scanning interferometry; scanning heterodyne interferometer system; surface displacement measurements; surface motions; ultrasonic transducer microarrays; vibrations; Biomembranes; Fabrication; Interferometry; Micromechanical devices; Piezoelectric transducers; Ultrasonic imaging; Ultrasonic transducer arrays; Ultrasonic transducers; Ultrasonic variables measurement; Voltage; Elasticity; Electric Capacitance; Electrodes; Equipment Failure Analysis; Interferometry; Light; Membranes, Artificial; Miniaturization; Motion; Nanotechnology; Sensitivity and Specificity; Transducers; Ultrasonics;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2002.1002467
  • Filename
    1002467