Title :
Transmission Gates Combined With Level-Restoring CMOS Gates Reduce Glitches in Low-Power Low-Frequency Multipliers
Author :
Carbognani, Flavio ; Buergin, Felix ; Felber, Norbert ; Kaeslin, Hubert ; Fichtner, Wolfgang
Author_Institution :
ETH Zurich, Zurich
fDate :
7/1/2008 12:00:00 AM
Abstract :
Various 16-bit multiplier architectures are compared in terms of dissipated energy, propagation delay, energy-delay product (EDP), and area occupation, in view of low-power low-voltage signal processing for low-frequency applications. A novel practical approach has been set up to investigate and graphically represent the mechanisms of glitch generation and propagation. It is found that spurious activity is a major cause of energy dissipation in multipliers. Measurements point out that, because of its shorter full-adder chains, the Wallace multiplier dissipates less energy than other traditional array multipliers (8.2 mu W/MHz versus 9.6 mu W/MHz for 0.18mum CMOS technology at 0.75 V). The benefits of transistor sizing are also evaluated (Wallace including minimum-size transistors dissipates 6.2 muW/MHz). By combining transmission gates with static CMOS in a Wallace architecture, a new approach is proposed to improve the energy-efficiency further (4.7 muW/MHz), beyond recently published low-power architectures. The innovation consists in suppressing glitches via resistance-capacitance low-pass filtering, while preserving unaltered driving capabilities. The reduced number of V dd-to-ground paths also contributes to a significant decrease of static consumption.
Keywords :
CMOS logic circuits; adders; logic gates; low-pass filters; low-power electronics; multiplying circuits; Wallace multiplier; energy dissipation; full-adder chain; glitch generation; level-restoring CMOS gate; low-power low-frequency multiplier; propagation delay; resistance-capacitance low-pass filtering; transistor sizing; transmission gate; CMOS technology; Energy dissipation; Energy efficiency; Energy measurement; Filtering; Low pass filters; Propagation delay; Signal processing; Size measurement; Technological innovation; Arithmetic; glitch; low frequency; low power; multiplier; switching activity; transmission gate;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2008.2000457