• DocumentCode
    747012
  • Title

    Cyclic-averaging for high-speed analysis of resonant converters

  • Author

    Foster, Martin P. ; Sewell, H. Isaac ; Bingham, Chris M. ; Stone, David A. ; Hente, Dirk ; Howe, Dave

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Sheffield, UK
  • Volume
    18
  • Issue
    4
  • fYear
    2003
  • fDate
    7/1/2003 12:00:00 AM
  • Firstpage
    985
  • Lastpage
    993
  • Abstract
    The paper describes the development and application of a cyclic-averaging technique for the rapid analysis of high-order resonant power converters. To provide a focus to the paper, particular emphasis is given to a 3rd-order LCC voltage output converter topology. The proposed methodology predicts steady-state voltages and currents throughout the circuit, and provides estimates of the stresses on the resonant circuit components. State-space simulations and experimental results from a 350 V-input/150 V-output converter are used to demonstrate a prediction accuracy comparable with time-domain integration-based techniques is achievable, while requiring only 1/10,000th of the computation time. In addition, a comparison with Spice simulation results shows that cyclic averaging provides commensurate predictions of voltage and current stresses on the resonant circuit components. Issues arising from the stray capacitance associated with the resonant inductor, and the corresponding sensitivity of the predicted output voltage, are also considered.
  • Keywords
    capacitance; resonant power convertors; state-space methods; time-domain analysis; 150 V; 350 V; current stresses; cyclic-averaging technique; high-order resonant power converters; resonant inductor; state-space simulations; stray capacitance; time domain analysis; voltage stresses; Accuracy; Circuit simulation; Circuit topology; Computational modeling; Predictive models; RLC circuits; Resonance; Steady-state; Stress; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2003.813763
  • Filename
    1214521