Title :
Minimum average cost testing for partially ordered components
Author :
Lipman, Marc J. ; Abrahams, Julia
Author_Institution :
Div. of Math., Comput. & Inf. Sci., Office of Naval Res., Arlington, VA, USA
fDate :
1/1/1995 12:00:00 AM
Abstract :
The problem of designing a sequence of optimal binary tests for the identification of a single faulty component is addressed. For components in linear order this is equivalent to the classical alphabetic coding problem solved by Hu and Tucker (1971). For partially ordered components the problem is solved by reduction to a minimization over a set of alphabetic problems
Keywords :
binary sequences; error detection codes; minimisation; search problems; source coding; tree data structures; tree searching; variable length codes; classical alphabetic coding problem; faulty component; identification; minimization; minimum average cost testing; optimal binary test sequences design; partially ordered components; Cost function; Electric breakdown; Fault diagnosis; Information theory; Monitoring; Pipelines; Search problems; System testing;
Journal_Title :
Information Theory, IEEE Transactions on
