DocumentCode
747334
Title
Efficient In-Package Decoupling Capacitor Optimization for I/O Power Integrity
Author
Chen, Jun ; He, Lei
Author_Institution
Dept. of Electr. Eng., California Univ., Los Angeles, CA
Volume
26
Issue
4
fYear
2007
fDate
4/1/2007 12:00:00 AM
Firstpage
734
Lastpage
738
Abstract
With high integration density of today´s electronic system and reduced noise margins, maintaining high power integrity becomes more challenging for high performance design. Inserting decoupling capacitors is one important and effective solution to improve the power integrity. The existing decoupling capacitor optimization approaches meet constraints on input impedance. In this paper, we show that impedance metric leads to large overdesign and then develop a noise-driven optimization algorithm for decoupling capacitors in packages for power integrity. We use the simulated annealing algorithm to minimize the total cost of decoupling capacitors under the constraints of a worst case noise bound. The key enabler for efficient optimization is an incremental worst case noise computation based on fast Fourier transform over incremental impedance matrix evaluation. Compared to the existing impedance-based approaches, our algorithm reduces the decoupling capacitor cost by 3times and is also more than 10times faster even with explicit noise computation
Keywords
capacitors; circuit optimisation; fast Fourier transforms; integrated circuit design; integrated circuit packaging; interference suppression; simulated annealing; design automation; fast Fourier transform; impedance matrix evaluation; impedance metric; inpackage decoupling capacitor optimization; input-output power integrity; noise computation; overdesign; simulated annealing algorithm; simultaneous switching noise; Capacitors; Design optimization; Frequency; Impedance; Integrated circuit noise; Noise reduction; Optimization methods; Packaging; Paramagnetic resonance; Simulated annealing; Decoupling capacitor; design automation; impedance; power integrity; simultaneous switching noise;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2006.888262
Filename
4135361
Link To Document