• DocumentCode
    747334
  • Title

    Efficient In-Package Decoupling Capacitor Optimization for I/O Power Integrity

  • Author

    Chen, Jun ; He, Lei

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA
  • Volume
    26
  • Issue
    4
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    734
  • Lastpage
    738
  • Abstract
    With high integration density of today´s electronic system and reduced noise margins, maintaining high power integrity becomes more challenging for high performance design. Inserting decoupling capacitors is one important and effective solution to improve the power integrity. The existing decoupling capacitor optimization approaches meet constraints on input impedance. In this paper, we show that impedance metric leads to large overdesign and then develop a noise-driven optimization algorithm for decoupling capacitors in packages for power integrity. We use the simulated annealing algorithm to minimize the total cost of decoupling capacitors under the constraints of a worst case noise bound. The key enabler for efficient optimization is an incremental worst case noise computation based on fast Fourier transform over incremental impedance matrix evaluation. Compared to the existing impedance-based approaches, our algorithm reduces the decoupling capacitor cost by 3times and is also more than 10times faster even with explicit noise computation
  • Keywords
    capacitors; circuit optimisation; fast Fourier transforms; integrated circuit design; integrated circuit packaging; interference suppression; simulated annealing; design automation; fast Fourier transform; impedance matrix evaluation; impedance metric; inpackage decoupling capacitor optimization; input-output power integrity; noise computation; overdesign; simulated annealing algorithm; simultaneous switching noise; Capacitors; Design optimization; Frequency; Impedance; Integrated circuit noise; Noise reduction; Optimization methods; Packaging; Paramagnetic resonance; Simulated annealing; Decoupling capacitor; design automation; impedance; power integrity; simultaneous switching noise;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2006.888262
  • Filename
    4135361