Title :
Robust Extraction of Spatial Correlation
Author :
Xiong, Jinjun ; Zolotov, Vladimir ; He, Lei
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY
fDate :
4/1/2007 12:00:00 AM
Abstract :
The increased variability of process parameters makes it important yet challenging to extract the statistical characteristics and spatial correlation of process variation. Recent progress in statistical static-timing analysis also makes the extraction important for modern chip designs. Existing approaches extract either only a deterministic component of spatial variation or these approaches do not consider the actual difficulties in computing a valid spatial-correlation function, ignoring the fact that not every function and matrix can be used to describe the spatial correlation. Applying mathematical theories from random fields and convex analysis, we develop: 1) a robust technique to extract a valid spatial-correlation function by solving a constrained nonlinear optimization problem and 2) a robust technique to extract a valid spatial-correlation matrix by employing a modified alternative-projection algorithm. Our novel techniques guarantee to extract a valid spatial-correlation function and matrix from measurement data, even if those measurements are affected by unavoidable random noises. Experiment results, obtained from data generated by a Monte Carlo model, confirm the accuracy and robustness of our techniques and show that we are able to recover the correlation function and matrix with very high accuracy even in the presence of significant random noises
Keywords :
Monte Carlo methods; correlation methods; integrated circuit design; statistical analysis; Monte Carlo model; alternative-projection algorithm; constrained nonlinear optimization; convex analysis; modern chip designs; nearest correlation matrix; process variation; random fields; robust extraction; spatial correlation; static-timing analysis; statistical characteristics; Algorithm design and analysis; CMOS technology; Chip scale packaging; Constraint optimization; Constraint theory; Data mining; Monte Carlo methods; Noise measurement; Noise robustness; Semiconductor device noise; Extraction; modeling; nearest correlation matrix; process variation; spatial correlation; valid spatial correlation function;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.884403