Title :
Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator
Author :
Elmquist, Randolph E. ; Hourdakis, Emmanouel ; Jarrett, Dean G. ; Zimmerman, Neil M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
Measurements of room-temperature 100 MΩ standard resistors and cryogenic thin-film resistors based directly on a quantized Hall resistance standard have been made with a cryogenic current comparator (CCC) bridge. This 15 496:2 ratio CCC attains a current sensitivity of 10.7 fA/Hz12/ in measurements of cryogenic thin-film resistors, without extensive shielding or filtering. A resistive primary winding helps the CCC maintain stability in the presence of external noise. The resistive-winding technique may be useful for the absolute measurement of small currents delivered by single-electron tunneling devices.
Keywords :
cryogenic electronics; current comparators; electric resistance measurement; measurement standards; quantum Hall effect; single electron devices; thin film resistors; 100 Mohm; Johnson noise; QHR; cryogenic current comparator; cryogenic thin-film resistors; currents measurement; quantized Hall resistance standard; quantum Hall effect; resistance comparisons; resistance standards; resistive primary winding; resistive-winding technique; single-electron tunneling devices; standard resistors; Bridges; Cryogenics; Current measurement; Electrical resistance measurement; Filtering; Measurement standards; Resistors; Stability; Transistors; Tunneling; Johnson noise; quantum Hall effect; resistance standards; single-electron tunneling;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2004.843330
