• DocumentCode
    747565
  • Title

    Quasi-monolithic toroidal cross-capacitor

  • Author

    Lee, Rae Duk ; Kim, Han Jun ; Semenov, Yu.P.

  • Author_Institution
    Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
  • Volume
    54
  • Issue
    2
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    538
  • Lastpage
    541
  • Abstract
    A quasi-monolithic toroidal cross-capacitor has been developed as an extremely stable and reliable capacitance standard of 0.5 pF. A geometrically symmetrical electrode structure is realized by using two identical plated substrates produced from fused silica with an exceedingly low thermal expansion coefficient. The capacitance instability expected after finishing the aging process does not exceed 5 × 10-8 per year. Investigations have shown that the capacitor developed for evaluation of the frequency dependence of the calculable cross-capacitor developed by Korea Research Institute of Standards and Science (KRISS), Daejeon, Korea, can be used as a substitute to maintain the capacitance unit, as well as a loss angle standard and a transfer standard to carry out intercomparisons.
  • Keywords
    capacitance measurement; capacitors; measurement standards; 0.5 pF; Daejeon; Korea; Korea Research Institute of Standards and Science; aging process; calculable cross-capacitor; capacitance instability; capacitance measurement; capacitance unit; frequency dependence; fused silica; geometrically symmetrical electrode; loss angle standard; quasimonolithic toroidal cross-capacitor; reliable capacitance standard; stable capacitance standard; thermal expansion coefficient; transfer standard; Capacitors; Circuits; Electrodes; Finishing; Frequency dependence; Quantum capacitance; Silicon compounds; Standards development; Thermal expansion; Uncertainty; Capacitance measurement; capacitors; frequency; losses; stability;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2004.843315
  • Filename
    1408228