Title :
Precision measurements of AC Josephson voltage standard operating margins
Author :
Burroughs, Charles J. ; Benz, Samuel P. ; Dresselhaus, Paul D. ; Chong, Yonuk
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
Recent advances in circuit design and fabrication of superconducting integrated circuits have enabled us to demonstrate an ac Josephson voltage standard (ACJVS) that generates both ac and dc waveforms up to 242-mV peak voltage. Using a Fast Fourier Transform spectrum analyzer and an ac-dc transfer standard, we characterize ACJVS operating margins by performing "flat-spot" measurements at the level of a part in 106 for all eight bias parameters. By verifying that every bias parameter has a "flat-spot" (i.e., a range of bias values over which the measured ACJVS output is precisely constant), we demonstrate that all Josephson junctions on the chip are operating properly.
Keywords :
Josephson effect; fast Fourier transforms; measurement standards; spectral analysers; superconducting integrated circuits; voltage measurement; AC Josephson voltage standard; AC measurements; AC waveform; AC-DC transfer standard; ACJVS operating margins; DC waveforms; Josephson arrays; Josephson devices; Josephson junctions; bias parameter; circuit design; fast Fourier transform; flat-spot measurements; precision measurements; spectrum analyzer; superconducting integrated circuits; AC generators; Circuit synthesis; DC generators; Fabrication; Fast Fourier transforms; Integrated circuit measurements; Measurement standards; Spectral analysis; Superconducting integrated circuits; Voltage; AC measurements; AC voltage standard; Josephson arrays; Josephson devices;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2004.843070