Title :
Progress on Johnson noise thermometry using a quantum voltage noise source for calibration
Author :
Nam, Sae Woo ; Benz, Samuel P. ; Dresselhaus, Paul D. ; Burroughs, Charles J., Jr. ; Tew, Wes L. ; White, D. Rod ; Martinis, John M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
We describe our progress toward a high-precision measurement of temperature using Johnson noise. Using a quantized voltage noise source (QVNS) based on the Josephson effect as a calculable noise source, we have been able to measure the ratio of the gallium and water triple-point temperatures to within an accuracy better than 100 μK/K. We also describe the operation of our Johnson noise thermometry system that could be used as a primary thermometer and possible sources of error that limit our absolute temperature measurements to ∼150 μK/K.
Keywords :
Josephson effect; calibration; electric noise measurement; quantisation (signal); superconductor-normal-superconductor devices; temperature measurement; thermal noise; Johnson noise thermometry; Josephson effect; Josephson junction arrays; calculable noise source; digital-analog conversion; frequency control; frequency synthesizers; gallium temperature; high-precision measurement; quantized voltage noise source; quantum voltage noise source; signal synthesis; superconducting microwave devices; superconductor-normal-superconductor devices; temperature measurement; voltage control; water triple-point temperatures; Calibration; Josephson junctions; NIST; Noise measurement; Power measurement; Resistors; Signal to noise ratio; Superconducting device noise; Temperature measurement; Voltage; Correlation; Josephson junction arrays; digital-analog conversion; frequency control; frequency synthesizers; noise; quantization; signal synthesis; standards; superconducting microwave devices; superconductor-normal-superconductor devices; temperature; temperature measurement; voltage control;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.843574