Title :
Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
fDate :
4/1/2005 12:00:00 AM
Abstract :
For the 7-term TRL calibration of a four-sampler vector network analyzer (VNA), expressions for the deviations of the S-parameters of two-port test objects are presented as functions of the deviations from the ideal values of the S-parameters of the TRL standards used. The sensitivity coefficients obtained are suitable for establishing the Type-B uncertainty budget for the S-parameter measurement.
Keywords :
S-parameters; calibration; measurement uncertainty; network analysers; sensitivity; two-port networks; S-parameter measurement; TRL standards; measurement uncertainty; nonideal TRL calibration; sensitivity coefficients; two-port test objects; vector network analyzer; Calibration; Impedance; Measurement standards; Measurement uncertainty; Microprogramming; Performance analysis; Performance evaluation; Reflection; Scattering parameters; Testing; 7-term TRL calibration; S-parameters; sensitivity coefficients; uncertainty of calibration; uncertainty of measurement; vector network analyzer;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.843521
