DocumentCode :
748040
Title :
A 2.4-GHz 0.18-μm CMOS self-biased cascode power amplifier
Author :
Sowlati, Tirdad ; Leenaerts, Domine M W
Author_Institution :
Philips Res.-USA, Briarcliff Manor, NY, USA
Volume :
38
Issue :
8
fYear :
2003
Firstpage :
1318
Lastpage :
1324
Abstract :
A two-stage self-biased cascode power amplifier in 0.18-μm CMOS process for Class-1 Bluetooth application is presented. The power amplifier provides 23-dBm output power with a power-added efficiency (PAE) of 42% at 2.4 GHz. It has a small signal gain of 38 dB and a large signal gain of 31 dB at saturation. This is the highest gain reported for a two-stage design in CMOS at the 0.8-2.4-GHz frequency range. A novel self-biasing and bootstrapping technique is presented that relaxes the restriction due to hot carrier degradation in power amplifiers and alleviates the need to use thick-oxide transistors that have poor RF performance compared with the standard transistors available in the same process. The power amplifier shows no performance degradation after ten days of continuous operation under maximum output power at 2.4-V supply. It is demonstrated that a sliding bias technique can be used to both significantly improve the PAE at mid-power range and linearize the power amplifier. By using the sliding bias technique, the PAE at 16 dBm is increased from 6% to 19%, and the gain variation over the entire power range is reduced from 7 to 0.6 dB.
Keywords :
Bluetooth; CMOS analogue integrated circuits; UHF integrated circuits; UHF power amplifiers; bootstrap circuits; 0.18 micron; 0.8 to 2.4 GHz; 19 percent; 2.4 GHz; 2.4 V; 31 dB; 38 dB; 42 percent; CMOS; Class-1 Bluetooth application; RF performance; bootstrapping technique; gain variation; hot carrier degradation; large signal gain; power-added efficiency; self-biased cascode power amplifier; self-biasing technique; sliding bias technique; small signal gain; thick-oxide transistors; Bluetooth; CMOS process; Degradation; Gain; Hot carriers; Operational amplifiers; Power amplifiers; Power generation; Radio frequency; Radiofrequency amplifiers;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.814417
Filename :
1214724
Link To Document :
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