• DocumentCode
    748212
  • Title

    In-pixel autoexposure CMOS APS

  • Author

    Yadid-Pecht, Orly ; Belenky, Alexander

  • Author_Institution
    VLSI Syst. Center, Ben-Gurion Univ., Beer-Sheva, Israel
  • Volume
    38
  • Issue
    8
  • fYear
    2003
  • Firstpage
    1425
  • Lastpage
    1428
  • Abstract
    A CMOS active pixel sensor (APS) with in-pixel autoexposure and a wide dynamic-range linear output is described. The chip features a unique architecture enabling a customized number of additional bits per pixel per readout, with minimal effect on the sensor spatial or temporal resolution. By utilizing multiple readouts via real-time feedback, each pixel in the field of view can automatically set an independent exposure time, according to its illumination. A customized, large increase in the dynamic range can be achieved and a scene containing both bright and dark regions can be captured. A prototype of 64 × 64 pixels has been fabricated using 1-poly 3-metal CMOS 0.5 μm n-well process available through MOSIS. Power dissipation is 3.7 mW at VDD = 5 V. The special functions have been verified experimentally, and an increase of 2 bits over the inherent dynamic range captured is shown.
  • Keywords
    CMOS image sensors; VLSI; circuit feedback; parallel architectures; 0.5 micron; 3.7 mW; 5 V; 64 pixel; CMOS active pixel sensor; CMOS n-well process; MOSIS; VLSI; column parallel architecture; in-pixel autoexposure CMOS APS; integration time; real-time feedback; wide dynamic-range linear output; CMOS image sensors; CMOS technology; Dynamic range; Feedback; Layout; Lighting; Pixel; Sensor phenomena and characterization; Spatial resolution; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2003.811984
  • Filename
    1214739