DocumentCode
748265
Title
Time-resolved impact ionization in ZnSe high-voltage switches
Author
Elezzabi, A.Y. ; Houtman, H. ; Meyer, J.
Author_Institution
Dept. of Phys., British Columbia Univ., Vancouver, BC, Canada
Volume
22
Issue
6
fYear
1994
fDate
12/1/1994 12:00:00 AM
Firstpage
1043
Lastpage
1048
Abstract
Fast electrical streamer and glow avalanches in ZnSe semiconductors are investigated, for applications in fast spontaneous or triggered switches. We present time-resolved observations of these self-sustained, impact ionization events in bulk polycrystalline ZnSe at room temperature. Under high voltages (~20 kV) short-current pulse (~3 ns) electrical excitation, the 1 ns risetime current pulses cause the emission of the bandgap radiation, which in turn is used to characterize the role of the plasma during the switching interval. Using a picosecond resolution streak camera, plasma streamers were recorded, in undoped ZnSe, and a uniform glow was observed in n-doped samples for the duration of the 3 ns, 1 kA current pulse. This paper concerns the behavior of the avalanche breakdown mechanism, which is relevant for applications in high energy switches, and we will discuss the possibility of using the avalanche process to pump high-power light-emitting semiconductor devices
Keywords
II-VI semiconductors; avalanche breakdown; glow discharges; impact ionisation; light emitting devices; photoconducting switches; power semiconductor switches; zinc compounds; 1 kA; 20 kV; 3 ns; ZnSe; ZnSe high-voltage switches; avalanche breakdown mechanism; bandgap radiation; bulk polycrystalline ZnSe; glow avalanches; high energy switches; high voltages; high-power light-emitting semiconductor devices; n-doped ZnSe; picosecond resolution streak camera; plasma streamers; room temperature; self-sustained impact ionization events; semiconductor; short-current pulse electrical excitation; spontaneous switches; streamer avalanches; time-resolved impact ionization; time-resolved observations; triggered switches; undoped ZnSe; Avalanche breakdown; Cameras; Energy resolution; Impact ionization; Photonic band gap; Plasma applications; Plasma temperature; Switches; Voltage; Zinc compounds;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.370252
Filename
370252
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