• DocumentCode
    748789
  • Title

    Evaluation of nonuniform WDM source spacing for EDFA gain characterization

  • Author

    Kulkarni, Shamal ; Medberry, John ; Lear, Kevin L.

  • Author_Institution
    Agilent Technol., Loveland, CO, USA
  • Volume
    14
  • Issue
    6
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    783
  • Lastpage
    785
  • Abstract
    The accuracy of erbium-doped fiber amplifier gain characterization tests has been evaluated using reduced sets of wavelength-division-multiplexing laser sources. Wavelength grids with both uniform and nonuniform wavelength spacing have been evaluated. Experiments show that it is necessary to maintain equal spectral density of source power per region in order to operate at the same saturation/inversion conditions of the amplifier. By doing so, acceptable results were obtained for a laser configuration with 400-800-GHz nonuniform spacing, employing 12 lasers.
  • Keywords
    erbium; optical communication equipment; optical fibre amplifiers; optical hole burning; population inversion; wavelength division multiplexing; 400-800-GHz nonuniform spacing; ASE spectrum; EDFA gain characterization; WDM laser source reduced sets; accuracy; equal spectral density; erbium-doped fiber amplifier; nonuniform WDM source spacing; nonuniform wavelength spacing; saturation/inversion conditions; source power; spectral hole burning; uniform wavelength spacing; wavelength grids; Costs; Erbium-doped fiber amplifier; Erbium-doped fiber lasers; Laser noise; Optical amplifiers; Optical attenuators; Power amplifiers; Power measurement; System testing; Wavelength division multiplexing;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2002.1003092
  • Filename
    1003092