Title :
Comparison of soft magnetic properties of Ni81Fe19 film with different substrates used for microfluxgate
Author :
Yang Shanglin ; Liu Shibin ; Guo Bo ; Feng Wenguang ; Hou Xiaowei
Author_Institution :
Sch. of Electron. & Inf., Northwestern Polytech. Univ., Xi´an, China
Abstract :
The soft magnetic properties of Ni81Fe19 films, respectively, composed of Ti, Ta and Cr substrates used for a microfluxgate have been studied in this reported work. The films were characterised using a transmission electron microscope, X-ray diffraction, a vibrating sample magnetometer and a fluxgate solenoid. The testing results showed that Ta substrate film, because of its ladder rising hysteresis loop, is the most appropriate one for the fluxgate core in these four kinds of Ni81Fe19 films, the original Ni81Fe19 film, and the film with Ti substrate takes second place, and the Cr substrate film would not be suitable as the fluxgate core because of its bad soft magnetic properties.
Keywords :
X-ray diffraction; iron alloys; magnetic hysteresis; magnetic thin films; magnetometry; metallic thin films; nickel alloys; soft magnetic materials; transmission electron microscopy; Cr; Cr substrate film; Ni81Fe19; TEM; Ta; Ta substrate film; Ti; Ti substrate; X-ray diffraction; XRD; film soft magnetic properties; fluxgate core; fluxgate solenoid; ladder rising hysteresis loop; microfluxgate; transmission electron microscope; vibrating sample magnetometer;
Journal_Title :
Micro & Nano Letters, IET
DOI :
10.1049/mnl.2013.0230