DocumentCode :
749380
Title :
Advanced active pixel architectures in standard CMOS technology
Author :
Marras, Alessandro ; Passeri, Daniele ; Matrella, Guido ; Placidi, Pisana ; Petasecca, Marco ; Servoli, Leonello ; Bilei, Gian Mario ; Ciampolini, Paolo
Author_Institution :
Dipt. di Ingegneria dell´´Informazione, Univ. di Parma, Perugia, Italy
Volume :
52
Issue :
5
fYear :
2005
Firstpage :
1869
Lastpage :
1872
Abstract :
This paper aims at exploring and validating the adoption of standard fabrication processes for the realization of CMOS active pixel sensors, for particle detection purposes. The goal is to implement a single-chip, complete radiation sensor system, including on a CMOS integrated circuit the sensitive devices, read-out and signal processing circuits. A prototype chip (RAPS01) based on these principles has been already fabricated, and a chip characterization has been carried out; in particular, the evaluation of the sensitivity of the sensor response on the actual operating conditions was estimated, as well as the response uniformity. Optimization and tailoring of the sensor structures for High Energy Physics applications are being evaluated in the design of the next generation chip (RAPS02). Basic features of the new chip includes digitally configurable readout and multi-mode access (i.e., either sparse of line-scan readout).
Keywords :
CMOS integrated circuits; optimisation; position sensitive particle detectors; readout electronics; signal processing; CMOS active pixel sensors; CMOS integrated circuit; RAPS02; advanced active pixel architectures; generation chip; high energy physics applications; line-scan readout; multimode access; optimization; particle detection; radiation sensor system; read-out circuits; signal processing circuits; single-chip system; standard CMOS technology; standard fabrication process; CMOS integrated circuits; CMOS process; CMOS technology; Design optimization; Fabrication; Integrated circuit technology; Prototypes; Sensor phenomena and characterization; Sensor systems; Signal processing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.856620
Filename :
1546518
Link To Document :
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