Induced-transparency in silicon-on-insulator based novel resonator systems

Author

Danfeng Cui ; Liping Wei ; Chao Liu ; Yaoying Liu ; Yonghua Wang ; Jun Liu ; Chenyang Xue

Author_Institution

Key Lab. of Instrum. Sci. & Dynamic Meas., North Univ. of China, Taiyuan, China

Volume

8

Issue

10

fYear

2013

fDate

Oct. 2013

Firstpage

619

Lastpage

622

Abstract

The coupled-resonator-induced-transparency (CRIT) phenomenon in a novel optical resonator system is experimentally demonstrated. The system is composed of a four-ring resonator with a 20 μm diameter on silicon, whose spectrum has a narrow transparency peak with low group velocity. The CRIT effect is observed in the optical coupled-resonator because of classical destructive interference. In this reported work, a CRIT resonance with a quality factor of 7.2 × 10⁴ is demonstrated with the same cavity size and the power coupling of the system is 60%, which agree well with the theoretical analysis. Then, through and drop transmission spectra of the resonator coincide well with each other. Simultaneously, the detuning resonant wavelength can be controlled by changing the temperature.

Keywords

Q-factor; optical resonators; self-induced transparency; silicon-on-insulator; CRIT effect; CRIT resonance; Si; cavity size; classical destructive interference; coupled-resonator-induced-transparency phenomenon; drop transmission spectra; four-ring resonator; group velocity; optical coupled-resonator; optical resonator system; power coupling; quality factor; resonant wavelength; silicon-on-insulator; size 20 mum; transparency peak;

fLanguage

English

Journal_Title

Micro & Nano Letters, IET

Publisher

iet

ISSN

1750-0443

Type

jour

DOI

10.1049/mnl.2013.0232

Filename

6651459