DocumentCode :
749509
Title :
Modular pipeline readout electronics for the SuperBelle drift chamber
Author :
Higuchi, T. ; Hazumi, M. ; Igarashi, Y. ; Ikeno, M. ; Itoh, R. ; Iwasaki, Y. ; Nakao, M. ; Nakayoshi, K. ; Suzuki, S.Y. ; Tanaka, M. ; Tauchi, K. ; Aulchenko, V. ; Bukin, M.A. ; Schwartz, B. ; Usov, Y. ; Wei, B. ; Varner, G.S. ; Kawasaki, T. ; Nakano, E.
Author_Institution :
Inst. of Particle & Nucl. Studies, Ibaraki, Japan
Volume :
52
Issue :
5
fYear :
2005
Firstpage :
1912
Lastpage :
1917
Abstract :
In order to explore new physics in B-meson decays we plan to upgrade the KEK B-factory to a luminosity of 5×1035 cm-2 s-1. In parallel we are developing a new pipelined data acquisition system for the Belle detector to cope with higher trigger rates of up to 30 kHz and severe background conditions. In order to reduce development and maintenance costs, we have adopted a modular design for these new readout electronics. The chosen architecture consists of a common readout platform, upon which are mounted subdetector specific parts, customized to meet the readout requirements of each sub detector component. As an example of this new architecture, we present in this paper the design of drift chamber electronics. The drift chamber readout utilizes the AMT-3 time-to-digital converter chip, originally developed for the ATLAS experiment, which satisfies the performance requirement for current and future Belle drift chamber readout. A data transfer performance test with emulation modules, mounted on the common platform, shows that the new readout electronics works well at a more than 30 kHz input trigger rate.
Keywords :
B mesons; data acquisition; drift chambers; high energy physics instrumentation computing; meson decay; position sensitive particle detectors; readout electronics; AMT-3 time-to-digital converter chip; ATLAS experiment; B-meson decays; Belle detector; Belle drift chamber readout; KEK B-factory; data acquisition system; drift chamber electronics; maintenance costs; modular design; modular pipeline readout electronics; subdetector component; trigger rates; Analog-digital conversion; Costs; Data acquisition; Detectors; Electronic equipment testing; Emulation; Helium; Nuclear physics; Pipelines; Readout electronics; Data acquisition; drift chamber electronics; high trigger rate; super B-factory;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2005.856913
Filename :
1546527
Link To Document :
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