Monte Carlo simulation for the prediction of the emission level from multiple sources inside shielded enclosures

Author

Goudos, Sotirios K. ; Vafiadis, Elias E. ; Sahalos, John N.

Author_Institution

Dept. of Phys., Aristotle Univ. of Thessaloniki, Greece

Volume

44

Issue

2

fYear

2002

fDate

5/1/2002 12:00:00 AM

Firstpage

291

Lastpage

308

Abstract

The emission level from multiple sources inside shielded enclosures is presented. Fields are expressed through the dyadic Green´s function. Integrated circuits are modeled as electric and magnetic dipoles. Induced electric current magnitudes on the walls of the enclosures are analytically calculated. Probabilistic models based on measurement data for various source configurations are derived and Monte Carlo simulations are produced. The results are used for the prediction of possible emission margins. Applications in PCB design are discussed and suggestions are made

Keywords

Green´s function methods; Monte Carlo methods; digital simulation; electric current; electromagnetic compatibility; electromagnetic induction; electromagnetic interference; electromagnetic shielding; integral equations; integrated circuit packaging; printed circuit design; probability; EMC; IC; Monte Carlo simulation; PCB design; dyadic Green´s function; electric dipoles; emission level prediction; emission margins; enclosures; induced electric current magnitudes; integral equations; integrated circuits; magnetic dipoles; multiple sources; probabilistic models; shielded enclosures; source configurations; Current; Electromagnetic compatibility; Electromagnetic interference; Integrated circuit measurements; Integrated circuit modeling; Magnetic analysis; Magnetic field measurement; Magnetic moments; Magnetic shielding; Simulated annealing;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2002.1003394

Filename

1003394