Title :
Monte Carlo simulation for the prediction of the emission level from multiple sources inside shielded enclosures
Author :
Goudos, Sotirios K. ; Vafiadis, Elias E. ; Sahalos, John N.
Author_Institution :
Dept. of Phys., Aristotle Univ. of Thessaloniki, Greece
fDate :
5/1/2002 12:00:00 AM
Abstract :
The emission level from multiple sources inside shielded enclosures is presented. Fields are expressed through the dyadic Green´s function. Integrated circuits are modeled as electric and magnetic dipoles. Induced electric current magnitudes on the walls of the enclosures are analytically calculated. Probabilistic models based on measurement data for various source configurations are derived and Monte Carlo simulations are produced. The results are used for the prediction of possible emission margins. Applications in PCB design are discussed and suggestions are made
Keywords :
Green´s function methods; Monte Carlo methods; digital simulation; electric current; electromagnetic compatibility; electromagnetic induction; electromagnetic interference; electromagnetic shielding; integral equations; integrated circuit packaging; printed circuit design; probability; EMC; IC; Monte Carlo simulation; PCB design; dyadic Green´s function; electric dipoles; emission level prediction; emission margins; enclosures; induced electric current magnitudes; integral equations; integrated circuits; magnetic dipoles; multiple sources; probabilistic models; shielded enclosures; source configurations; Current; Electromagnetic compatibility; Electromagnetic interference; Integrated circuit measurements; Integrated circuit modeling; Magnetic analysis; Magnetic field measurement; Magnetic moments; Magnetic shielding; Simulated annealing;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2002.1003394
