• DocumentCode
    749648
  • Title

    Subpixel measurements using a moment-based edge operator

  • Author

    Lyvers, Edward P. ; Mitchell, Owen Robert ; Akey, Mark L. ; Reeves, Anthony P.

  • Author_Institution
    MIT Lincoln Lab., Lexington, MA, USA
  • Volume
    11
  • Issue
    12
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    1293
  • Lastpage
    1309
  • Abstract
    Recent results in precision measurements using computer vision are presented. An edge operator based on two-dimensional spatial moments is given. The operator can be implemented for virtually any size of window and has been shown to locate edges in digitized images to a twentieth of a pixel. This accuracy is unaffected by additive or multiplicative changes to the data values. The precision is achieved by correcting for many of the deterministic errors caused by nonideal edge profiles using a lookup table to correct the original estimates of edge orientation and location. This table is generated using a synthesized edge which is located at various subpixel locations and various orientations. The operator is extended to accommodate nonideal edge profiles and rectangularly sampled pixels. The technique is applied to the measurement of imaged machined metal parts. Theoretical and experimental noise analyses show that the operator has relatively small bias in the presence of noise
  • Keywords
    computerised pattern recognition; computerised picture processing; table lookup; computer vision; deterministic errors; digitized images; edge location; edge orientation; imaged machined metal parts; lookup table; moment-based edge operator; noise analyses; pattern recognition; picture processing; subpixel measurements; two-dimensional spatial moments; Computer vision; Detectors; Error correction; Face detection; Image edge detection; Image processing; Image sampling; Laplace equations; Pixel; Table lookup;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.41367
  • Filename
    41367