Title :
Performance of an imaging system based on silicon pixel detectors of different thickness
Author :
Bisogni, M.G. ; Boscardin, M. ; Bulajic, D. ; Betta, G. F Dalla ; Delogu, P. ; Fantacci, M.E. ; Novelli, M. ; Piemonte, C. ; Quattrocchi, M. ; Rosso, V. ; Stefanini, A. ; Zorzi, N.
Author_Institution :
Dipt. di Fisica, Univ. di Pisa, Italy
Abstract :
To compare the characteristics of imaging systems based on pixel detectors of different thickness, we have measured the respective imaging capabilities, spatial resolution and spectroscopic characteristics. Each system consists of a single photon counting chip, developed in the framework of the Medipix Collaboration, bump bonded to a silicon detector. The detector is a matrix of 64 × 64 square pixels, with 170 μm pitch and thickness ranging from 300 to 800 μm. As expected, the intrinsic detection efficiency increases with the detector thickness; nevertheless the spatial resolution can be affected by a charge sharing mechanism between adjacent pixels due to charge diffusion. The aim of the work reported in this paper is to demonstrate that, optimizing the settings of the image systems, we can increase the detection efficiency without losing in spatial resolution.
Keywords :
image resolution; nuclear electronics; photon counting; position sensitive particle detectors; silicon radiation detectors; Medipix Collaboration; charge diffusion; charge sharing mechanism; detector thickness; imaging system performance; intrinsic detection efficiency; silicon pixel detectors; single photon counting chip; spatial resolution; spectroscopic characteristics; Bonding; Collaboration; Counting circuits; Detectors; Pixel; Production; Semiconductor device measurement; Silicon; Spatial resolution; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.856820