Title :
XPAD: pixel detector for material sciences
Author :
Basolo, S. ; Bérar, J. -F ; Boudet, N. ; Breugnon, P. ; Caillot, B. ; Clemens, J.-C. ; Delpierre, P. ; Dinkespiler, B. ; Koudobine, I. ; Meessen, C. ; Menouni, M. ; Mouget, C. ; Pangaud, P. ; Potheau, R. ; Vigeolas, E.
Author_Institution :
CPPM-IN2P3, Marseille, France
Abstract :
Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. The XPAD prototype, using active pixels, has been developed to fulfil the needs of materials science scattering experiments. At the time, its prototype is build of eight modules of eight chips. The threshold calibration of ≈4 104 pixels is discussed. Applications to powder diffraction or SAXS experiments prove that it allows to record high quality data.
Keywords :
X-ray scattering; nuclear electronics; photon counting; position sensitive particle detectors; powder technology; 2D detectors; SAXS experiments; XPAD photon counting detector; XPAD prototype; active pixel detector; eight chip modules; high flux; material science scattering experiments; powder diffraction; third generation synchrotron sources; threshold calibration; Detectors; Diodes; Electromagnetic scattering; Materials science and technology; Optoelectronic and photonic sensors; Particle scattering; Powders; Prototypes; Switches; Synchrotrons; Detector; SAXS; pixel; powder diffraction; synchrotron;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2005.856818
