• DocumentCode
    749688
  • Title

    Dynamic Analysis of High-Power and High-Speed Near-Ballistic Unitraveling Carrier Photodiodes at W -Band

  • Author

    Wu, Y.-S. ; Shi, J.-W.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Taoyuan
  • Volume
    20
  • Issue
    13
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    1160
  • Lastpage
    1162
  • Abstract
    In this letter, we demonstrate and analyze the high-speed and high-power performance of a back-illuminated near-ballistic unitraveling-carrier photodiode (PD) at TV-band. We utilize a three-port equivalent-circuit-modeling technique to show that the extracted average electron drift velocity in the whole epi-structure is around 5times107 cm/s, which corresponds to an ultrahigh transit time limited bandwidth (~400 GHz). Such high internal bandwidth means that the demonstrated device can thus release the burden imposed on downscaling the device active area and epi-layer thickness for achieving ultrahigh-speed performance of PDs. With a collector thickness of 410 nm and an active area of 64 mum2, we can achieve a wide 3-dB bandwidth (120 GHz), and high saturation current bandwidth product performance (120 GHz, 24.6 mA, 2952 mAGHz) under 25 Omega loading at W-band.
  • Keywords
    microwave devices; photodiodes; W-band; current 24.6 mA; electron drift velocity; frequency 120 GHz; frequency 400 GHz; high power photodiodes; high speed photodiodes; near ballistic unitraveling carrier photodiodes; resistance 25 ohm; three port equivalent-circuit-modeling technique; wavelength 410 nm; Absorption; Bandwidth; Electron mobility; Helium; Image analysis; Indium phosphide; Lenses; Microoptics; Performance analysis; Photodiodes; $W$-band; High-power photodiode (PD); photodiodes (PDs);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.925195
  • Filename
    4542855