Title :
Reliability of new semiconductor devices for long-distance optical submarine-cable systems
Author :
Tatekura, Koichi ; Niro, Y.
Author_Institution :
Kokusai Denshin Denwa Co. Ltd., Tokyo, Japan
fDate :
4/1/1988 12:00:00 AM
Abstract :
Results from reliability tests conducted on three types of semiconductor devices used in optical repeaters are reported. The devices tested are: two types of 1.3-μm-band InGaAsP/InP laser diodes: a Ge avalanche photodiode; and monolithic integrated circuits. The devices have proved to be suitable for use in a long-distance optical submarine-cable system, such as the third transpacific cable system
Keywords :
III-V semiconductors; avalanche photodiodes; circuit reliability; elemental semiconductors; gallium arsenide; germanium; indium compounds; integrated circuit testing; monolithic integrated circuits; optical cables; optical communication equipment; optical links; reliability; repeaters; semiconductor device testing; semiconductor junction lasers; submarine cables; 1.3 micron; Ge avalanche photodiode; InGaAsP-InP lower diodes; long-distance optical submarine-cable systems; monolithic integrated circuits; optical repeaters; reliability tests; semiconductor devices; Circuit testing; Diode lasers; Indium phosphide; Integrated circuit reliability; Integrated circuit testing; Optical devices; Repeaters; Semiconductor device reliability; Semiconductor device testing; Semiconductor devices;
Journal_Title :
Reliability, IEEE Transactions on
