• DocumentCode
    750016
  • Title

    The QP Triangle: A Graphical Method for Bias Design

  • Author

    Whalen, James J. ; Glinksi, Philip T.

  • Volume
    19
  • Issue
    2
  • fYear
    1976
  • fDate
    5/1/1976 12:00:00 AM
  • Firstpage
    46
  • Lastpage
    53
  • Abstract
    A graphical design procedure is presented based upon a QP triangle for the design of bipolar transistor (BJT) bias circuits. The design technique stresses quiescent point (QP) location on the IC-VCE characteristics and considers the effects of simultaneous variations in the BJT parameters hFE, VBE, and ICO upon QP location. The QP triangle method is developed for the standard one-battery BJT CE stage discussed in many introductory electronic circuits textbooks. The QP triangle method is applied to a specific CE stage which has to meet certain design specifications. One important specification is that the circuit must operate over the temperature range 25-100°C with silicon N-P-N BJT\´s having values of h 40 and hFE 100°C) < 200. The available tradeoffs between the peak-to-peak voltage Vpp and the current gain AI are stressed and the best available design is selected. The performance of the selected design was simulated on a digital computer and measured in the laboratory. Both the computer simulation and the experiment are in good agreement with the design. The QP triangle method has been used in an introductory electronic circuits course with success for several years. Students understand this graphical design procedure and are able to apply it. It is recommended for beginning electronics students. An interactive computer program AMPDSN to aid students and instructors design the standard one-battery BJT CE stage is also described. An algorithm based upon the QP triangle is used. The program language is Basic.
  • Keywords
    Bipolar transistors; Computer simulation; Design methodology; Electronic circuits; Iron; Quadratic programming; Silicon; Standards development; Stress; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/TE.1976.4321036
  • Filename
    4321036