DocumentCode :
750186
Title :
Analysis of the {\\rm TE} -Pass or {\\rm TM} -Pass Metal-Clad Polarizer With a Resonant Buffer La
Author :
Li, Guangyuan ; Xu, Anshi
Author_Institution :
Sch. of Electron. Eng. & Comput. Sci., Peking Univ., Beijing
Volume :
26
Issue :
10
fYear :
2008
fDate :
5/15/2008 12:00:00 AM
Firstpage :
1234
Lastpage :
1241
Abstract :
A metal-clad optical polarizer with a resonant buffer layer has been investigated by the finite-element method in this paper. Important waveguide design parameters, such as the refractive index, thickness, interaction length, fabrication tolerance, and band-stop characteristics, have been analyzed in detail. Mode coupling within the polarizer and the losses due to coupling between the polarizer and the input and output waveguides are considered using the normal mode analysis. The loss behaviors of and modes are explained and the roles of the resonant buffer layer are interpreted. By using ultralow index layers, resonance, as well as its phase-matching conditions and excellent performance, has also been presented and discussed for this structure for the first time. Simulations show that high performance can be achieved in a wide range of the cladding thicknesses (ges 2 mum) and interaction length for both TE-pass and TM-pass polarizers. With optimized parameters under 3-mm length, it is possible to obtain a broadband TE-pass polarizer with an extinction ratio of more than 40 dB and insertion loss below 0.2 dB over 200 nm, and a TM-pass polarizer with an extinction ratio of more than 30 dB and insertion loss below 0.4 dB over 28 nm.
Keywords :
finite element analysis; optical polarisers; optical waveguides; TE-pass metal-clad polarizer; TM-pass metal-clad polarizer; TM-pass polarizer; band-stop characteristics; broadband TE-pass polarizer; cladding thicknesses; fabrication tolerance; finite element method; finite-element method; interaction length; loss behaviors; metal-clad optical polarizer; metal-clad waveguides; modal loss; mode coupling; normal mode analysis; phase-matching conditions; refractive index; resonant buffer layer; ultralow index layers; waveguide design parameters; Buffer layers; Extinction ratio; Image analysis; Insertion loss; Optical buffering; Optical polarization; Optical refraction; Optical waveguides; Resonance; Tellurium; Finite-element method (FEM); metal-clad waveguides; modal loss; normal mode analysis; optical polarizers;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2008.917039
Filename :
4542908
Link To Document :
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