• DocumentCode
    750230
  • Title

    IDDQ-based diagnosis at very low voltage (VLV) for bridging defects

  • Author

    Arumi, D. ; Rodríguez-Montañés, R. ; Figueras, J. ; Eichenberger, S. ; Hora, C. ; Kruseman, B. ; Lousberg, M.

  • Author_Institution
    Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona
  • Volume
    43
  • Issue
    5
  • fYear
    2007
  • Firstpage
    25
  • Lastpage
    26
  • Abstract
    Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply (VDD) values, thus facilitating the diagnosis of such defects. Experimental evidence of this behaviour is presented
  • Keywords
    CMOS integrated circuits; electric current measurement; fault simulation; integrated circuit testing; CMOS technologies; IDDQ-based diagnosis; bridge current; bridging defects; downstream current; fault-free case;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20073573
  • Filename
    4137468
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=750230