Title :
IDDQ-based diagnosis at very low voltage (VLV) for bridging defects
Author :
Arumi, D. ; Rodríguez-Montañés, R. ; Figueras, J. ; Eichenberger, S. ; Hora, C. ; Kruseman, B. ; Lousberg, M.
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona
Abstract :
Bridging defects generate two currents related to the fault-free case: bridge current and downstream current. The latter may complicate the diagnosis of bridging defects. However, in CMOS technologies, the downstream current can be minimised at low power supply (VDD) values, thus facilitating the diagnosis of such defects. Experimental evidence of this behaviour is presented
Keywords :
CMOS integrated circuits; electric current measurement; fault simulation; integrated circuit testing; CMOS technologies; IDDQ-based diagnosis; bridge current; bridging defects; downstream current; fault-free case;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20073573
