• DocumentCode
    750464
  • Title

    Reliability development and qualification of a low-cost PQFP-based MCM

  • Author

    Thompson, Patrick

  • Author_Institution
    Semicond. Products Sector, Motorola Inc., Tempe, AZ, USA
  • Volume
    18
  • Issue
    1
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    10
  • Lastpage
    14
  • Abstract
    In Motorola´s experience with commercial MCM customers, cost and size reduction are the largest driving factors for interest in MCM´s. Speed and other performance factors are of secondary interest. Development and qualification can add significantly to the total cost of an MCM, so in addition to the normal desire to provide reliable products, the cost of doing so has gained increased importance. Motorola has identified three key factors in providing cost-effective MCM´s: leverage single chip package experience, qualify MCM product families (package types), and use only qualified silicon devices in MCM products. This paper describes application of the three key factors to the reliability qualification of the 28-mm MCML Series package, a PQFP-(Plastic Quad Flat Pack) based MCM. An initial reliability evaluation was performed to investigate reliability issues. As a result of the initial evaluation, changes were made to assembly processes and materials. The MCM was then submitted to a suite of reliability stresses selected to evaluate mechanical, thermo-mechanical, moisture, and longevity performance. The MCM passed electrical and visual (SAT, or Scanning Acoustic Tomography) reliability requirements for all stresses, and performed well in extended stress tests as well. A procedure is in place to help insure high reliability for additional products in the 28-mm PQFP-based MCM package
  • Keywords
    environmental testing; integrated circuit packaging; integrated circuit reliability; life testing; moisture measurement; multichip modules; 28 mm; MCML Series package; PQFP-based MCM; assembly processes; cost; extended stress tests; longevity performance; mechanical performance; moisture performance; package types; performance factors; qualified silicon devices; reliability qualification; reliability stresses; scanning acoustic tomography; single chip package; size reduction; thermo-mechanical performance; Assembly; Costs; Electronics packaging; Moisture; Performance evaluation; Qualifications; Silicon devices; Thermal stresses; Thermomechanical processes; Tomography;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.370728
  • Filename
    370728