Title :
Liquid cooling performance for a 3-D multichip module and miniature heat sink
Author :
Vogel, Marlin R.
Author_Institution :
Adv. Technol. Dept., Sun Microsyst. Inc., Milpitas, CA, USA
fDate :
3/1/1995 12:00:00 AM
Abstract :
Measured thermal performance is presented for a single phase liquid-cooled module. Tape automated bonded (TAB) thermal test chips and their associated substrates are stacked in a compact, 3-D liquid-tight module. A dielectric liquid, polyalphaolefin (PAO), is forced to flow past the active and inactive sides of TAB chips. At a volumetric flowrate of 0.05 gallons per minute (gpm) and an estimated pressure loss less than 0.5 psi, the measured junction-to-liquid thermal resistance is 2.0 C/W for a 0.50 in.×0.50 in.×0.015 in. thermal test chip. The thermal resistance was also measured for an indirect liquid-cooling approach. PAO was used to cool a miniature sink mounted directly to a 0.50 in.×0.50 in. heat source. The heat source was used to simulate the thermal characteristics of a chip carrier package. The overall dimension of the liquid heat sink is 1.0 in.×1.0 in.×0.28 in. The measured junction-to-liquid thermal resistance is 0.52 C/W for a flowrate of 0.05 gpm, and for an estimated pressure loss less than 1.0 psi. Numerical computational techniques yielded results which were comparable to the measured thermal resistances for both the 3-D module and the miniature heat sink. Enhanced thermal performance gained by introducing micro-encapsulated phase change material (microPCM) to the PAO is estimated for both the 3-D module and the miniature heat sink
Keywords :
cooling; dielectric liquids; heat sinks; multichip modules; tape automated bonding; thermal resistance; 3-D multichip module; PAO; chip carrier package; dielectric liquid flow; indirect liquid-cooling; junction-to-liquid thermal resistance; micro-encapsulated phase change material; miniature heat sink; numerical computation; polyalphaolefin; single phase liquid-cooling; substrates; tape automated bonded chips; thermal performance; Dielectric loss measurement; Dielectric measurements; Electrical resistance measurement; Heat sinks; Liquid cooling; Loss measurement; Multichip modules; Pressure measurement; Semiconductor device measurement; Thermal resistance;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on