Title :
Exceptional performance from the development, qualification and implementation of a silicone adhesive for bonding heatsinks to semiconductor packages
Author :
Bosworth, Stephen ; Hsu, Shih C. ; Polcari, Joseph
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
fDate :
3/1/1995 12:00:00 AM
Abstract :
The stress induced by the Coefficient of Thermal Expansion (CTE) mismatch of ceramic semiconductor packages bonded to aluminum heatsinks created a high risk of cracking. As packages increase in size and power, the need for an advanced adhesive with compliant properties, reliable bond strengths and high thermal performance is required. The demand for high speed semiconductor CPU´s in today´s marketplace created a requirement for an effective, low-cost thermal management solution for packaging. This paper describes the methodology and analysis used to develop, qualify, and implement a new heatsink adhesive attach strategy into manufacturing. Included are the resultant benefits and potential applications for future product designs using this Low Modulus Adhesive (LMA). The project goal was to “Implement LMA into manufacturing for all permanent heatsink attach products”. This included both current and future products, with the heatsink attach strategy of “low volume, high mix” product capability. As a result of the work reported here, heatsink attach capabilities have been enhanced significantly with attractive cost benefits. Concurrent engineering was emphasized to deliver a high quality and low-cost process to production in a timely manner. The material, process, and equipment has been running in a low volume production facility with 100% yield. This technology is planned for transfer to a high volume production facility
Keywords :
adhesion; concurrent engineering; heat sinks; semiconductor device packaging; silicones; thermal stress cracking; Al; aluminum heatsinks; bond strengths; bonding; ceramic semiconductor packages; coefficient of thermal expansion mismatch; compliant properties; concurrent engineering; cracking; high speed semiconductor CPUs; low modulus adhesive; low volume production facility; manufacturing; packaging; silicone adhesive; stress; thermal management; Aluminum; Bonding; Ceramics; Heat sinks; Production facilities; Qualifications; Semiconductor device packaging; Thermal expansion; Thermal management; Thermal stresses;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on