DocumentCode :
750687
Title :
Thin-film decoupling capacitors for multichip modules
Author :
Dimos, Duane ; Lockwood, Steven J. ; Schwartz, Robert W. ; Rodgers, M. Steven
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
18
Issue :
1
fYear :
1995
fDate :
3/1/1995 12:00:00 AM
Firstpage :
174
Lastpage :
179
Abstract :
Thin-film decoupling capacitors based on ferroelectric lead lanthanum zirconate titanate (PLZT) films are being developed for use in advanced packages, such as multichip modules. These thin-film decoupling capacitors are intended to replace multilayer ceramic capacitors for certain applications, since they can be more fully integrated into the packaging architecture. The increased integration that can be achieved should lead to decreased package volume and improved highspeed performance, due to a decrease in interconnect inductance. PLZT films are fabricated by spin coating using metal carboxylate/alkoxide solutions. These films exhibit very high dielectric constants (ε⩾900), low dielectric losses (tan δ≈0.01), excellent insulation resistances (ρ>1013 Ω-cm at 125°C), and good breakdown field strengths (EB≈900 kV/cm). For integrated circuit applications, the PLZT dielectric is less than 1 μm thick, which results in a large capacitance/area (8-9 nF/mm 2). The thin-film geometry and processing conditions also make these capacitors suitable for direct incorporation onto integrated circuits and for packages that require embedded components
Keywords :
dielectric losses; electric strength; ferroelectric capacitors; ferroelectric thin films; integrated circuit packaging; lanthanum compounds; lead compounds; multichip modules; permittivity; piezoceramics; thin film capacitors; 125 degC; PLZT; PLZT dielectric; PLZT films; PbLaZrO3TiO3; breakdown field strengths; dielectric constants; dielectric losses; embedded components; insulation resistances; integrated circuit applications; interconnect inductance; metal carboxylate/alkoxide solutions; multichip modules; package volume; packaging architecture; processing conditions; spin coating; thin-film decoupling capacitors; Capacitors; Dielectric losses; Ferroelectric films; Ferroelectric materials; Lanthanum; Multichip modules; Nonhomogeneous media; Packaging; Titanium compounds; Transistors;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.370752
Filename :
370752
Link To Document :
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