• DocumentCode
    750770
  • Title

    Gold wire weakening in the thermosonic bonding of the first bond

  • Author

    Hu, Shze J. ; Lim, Richard K S ; Sow, G.Y.

  • Author_Institution
    Univ. of Sci., Penang, Malaysia
  • Volume
    18
  • Issue
    1
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    230
  • Lastpage
    234
  • Abstract
    Factors that are likely to weaken gold wire during thermosonic wirebonding of the first bond on the die pad are studied. The studies show that weakening is due mainly to the golf club ball formation, grain growth of wire, neckdown formation, tie-bar severance, and the wire-scratching phenomenon. Golf club ball formation can be eliminated by long tail length and wire grain size after recrystallization, can be reduced by low current supplied and short spark time during the EFO excitation. Neckdown and tie-bar severance can be removed by introducing reverse loop and ensuring no indexing problem during the wirebonding process. Wire scratching and dragging due to inside chamfer can be eliminated when the capillary for bonding is not too worn out
  • Keywords
    gold; grain growth; grain size; integrated circuit packaging; lead bonding; materials testing; mechanical strength; Au; Au wire weakening; die pad initial bond; golf club ball formation; grain growth; neckdown formation; reverse loop; thermosonic bonding; tie-bar severance; wire grain size; wire-scratching phenomenon; wirebonding; Bonding processes; Current supplies; Gold; Grain size; Indexing; Scanning electron microscopy; Sparks; Testing; Wafer bonding; Wire;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.370760
  • Filename
    370760