Title :
Noise Transfer Characteristics in a Semiconductor Optical Amplifier With Application to Wavelength Conversion Based on a Delay Interferometer
Author :
Tang, Xuefeng ; Kim, Na Young ; Cartledge, John C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Queen´´s Univ., Kingston, ON
fDate :
6/15/2008 12:00:00 AM
Abstract :
A theoretical model is presented to analyze the noise transfer characteristics in a semiconductor optical amplifier (SOA) under the excitation of a noisy pump signal and a noise-free probe signal. An analytical expression is derived for the optical signal-to-noise ratio (OSNR) of the output probe signal from the SOA. The influence of the gain saturation of the SOA, and the pump and probe signal powers on the noise transfer characteristics is investigated. The noise transfer model is used to determine the output noise power of a delay interference wavelength converter. An analytical expression is obtained for the nonlinear phase change in the SOA, which determines the output power of the wavelength-converted signal. These results show that the noise transfer in the wavelength conversion can be suppressed by increasing the probe signal power, but that the improvement in the output signal OSNR relative to the input signal OSNR is accompanied by a reduction in the conversion efficiency. This fundamental tradeoff can be readily investigated during the design optimization process using the concise results derived in this paper.
Keywords :
delays; laser beams; laser noise; light interferometers; optical modulation; optical saturation; optical wavelength conversion; optimisation; semiconductor optical amplifiers; cross-phase modulation; delay interference wavelength converter; delay interferometer; design optimization; gain saturation; noise power; noise transfer characteristics; noise-free probe signal; noisy pump signal; nonlinear phase change; optical noise; optical signal-to-noise ratio; semiconductor optical amplifier; Nonlinear optics; Optical interferometry; Optical noise; Optical wavelength conversion; Probes; Propagation delay; Semiconductor device noise; Semiconductor optical amplifiers; Signal analysis; Signal to noise ratio; Cross phase modulation (XPM); optical noise; semiconductor optical amplifier (SOA); wavelength conversion;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2008.923911