• DocumentCode
    751076
  • Title

    Enhanced Topology Error Processing via Optimal Measurement Design

  • Author

    Chen, Jian ; Abur, Ali

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX
  • Volume
    23
  • Issue
    3
  • fYear
    2008
  • Firstpage
    845
  • Lastpage
    852
  • Abstract
    Topology errors constitute one of the significant source of problems for today´s state estimators. They may cause significant biases in state estimation solutions and may occasionally lead to divergence of the numerical solution algorithms. Existing methods of detecting and identifying topology errors rely on the measurement residuals which are in turn dependent on the measurement configuration and network topology. Hence, the capability to effectively process topology errors is closely linked to proper measurement design. In particular, detection of a topology error associated with a given branch may or may not be possible depending upon the existing measurement configuration. Hence, it is possible to efficiently improve the topology error processing capability for a given system by strategically placing few extra measurements. In this paper, a systematic procedure will be developed in order to accomplish this by using not only the traditional power flow and injection measurements but also the newly emerging phasor measurement units (PMUs). Numerical examples will be provided in order to illustrate the proposed measurement placement strategy.
  • Keywords
    numerical analysis; phase measurement; power system measurement; power system state estimation; load flow; measurement residuals; numerical solution algorithms; optimal measurement design; phasor measurement units; state estimators; topology error processing; Bad data processing; detection; identification; meter placement; observability; phasor measurement units; state estimation; topology error processing;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2008.926083
  • Filename
    4543032