Title :
A 3.2 Gbps/pin 8 Gbit 1.0 V LPDDR4 SDRAM With Integrated ECC Engine for Sub-1 V DRAM Core Operation
Author :
Tae-Young Oh ; Hoeju Chung ; Jun-Young Park ; Ki-Won Lee ; Seunghoon Oh ; Su-Yeon Doo ; Hyoung-Joo Kim ; ChangYong Lee ; Hye-Ran Kim ; Jong-Ho Lee ; Jin-Il Lee ; Kyung-Soo Ha ; YoungRyeol Choi ; Young-Chul Cho ; Yong-Cheol Bae ; Taeseong Jang ; Chulsung P
Author_Institution :
Memory Div., Samsung Electron., Hwasung, South Korea
Abstract :
A 1.0 V 8 Gbit LPDDR4 SDRAM with 3.2 Gbps/pin speed and integrated ECC engine for sub-1 V DRAM core is presented. DRAM internal read-modify-write operation for data masked write makes the integrated ECC engine possible in a commodity DRAM. Time interleaved latency and IO control circuits enable 1.0 V operation at target speed. To reach 3.2 Gbps with improved power efficiency over conventional mobile DRAMs, the following IO features are introduced: Low voltage swing terminated logic drivers with VOH level calibration and periodic ZQ calibration, unmatched DQ/DQS scheme and DQS oscillator for DQS tree delay tracking. This chip is fabricated in 25 nm DRAM process on 88.1 mm 2 die area.
Keywords :
DRAM chips; SRAM chips; error correction codes; DQS oscillator; DQS tree delay tracking; DRAM internal read-modify-write operation; IO control circuits; LPDDR4 SDRAM; VOH level calibration; conventional mobile DRAMs; data masked write; error correction coding; integrated ECC engine; low voltage swing terminated logic drivers; periodic ZQ calibration; power efficiency; size 25 nm; storage capacity 8 Gbit; time interleaved latency; unmatched DQ-DQS scheme; voltage 1.0 V; Clocks; Decoding; Engines; Error correction codes; SDRAM; Timing; DMI; DQS oscillator; ECC; LPDDR4; LVSTL; VOH calibration; ZQ calibration; latency control; masked write; mobile DRAM; tDQS2DQ;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2014.2353799